Multiple Diffraction of X-Rays in Crystals

Multiple Diffraction of X-Rays in Crystals

AngličtinaMěkká vazba
In-Hang Shih-Lin
Springer, Berlin
EAN: 9783642821684
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Podrobné informace

The three-dimensional arrangement of atoms and molecules in crystals and the comparable magnitude of x-ray wavelengths and interatomic distances make it possible for crystals to have more than one set of atomic planes that satisfy Bragg's law and simultaneously diffract an incident x-ray beam - this is the so-called multiple diffraction. This type of diffraction should, in prin­ ciple, reflect three-dimensional information about the structure of the dif­ fracting material. Recent progress in understanding this diffraction phenome­ non and in utilizing this diffraction technique in solid-state and materials sciences reveals the diversity as well as the importance of multiple diffraction of x-rays in application. Unfortunately, there has been no single book written that gives a sys­ tematic review of this type of diffraction, encompasses its diverse applica­ tions, and foresees future trends gf development. It is for this purpose that this book is designed. It is hoped that its appearance may possibly turn more attention of condensed-matter physicists, chemists and material scientists toward this particular phenomenon, and that new methods of non-destructive analysis of matter using this diffraction technique may be developed in the future.
EAN 9783642821684
ISBN 3642821685
Typ produktu Měkká vazba
Vydavatel Springer, Berlin
Datum vydání 22. prosince 2011
Stránky 300
Jazyk English
Rozměry 235 x 155
Země Germany
Sekce Professional & Scholarly
Autoři In-Hang Shih-Lin
Ilustrace XI, 300 p.
Edice Softcover reprint of the original 1st ed. 1984
Série Springer Series in Solid-State Sciences