Transmission Electron Microscopy

Transmission Electron Microscopy

AngličtinaEbook
Williams, David B.
Springer US
EAN: 9781475725193
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Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi- of materials by completing the processing-structure-prop- croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them- to achieve specific sets of properties; the extraordinary abili- selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM- of all of these areas before one can hope to tackle signifi- instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate- be used with care and attention, in many cases involving rials education must include suitable courses in electron mi- teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci- for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
EAN 9781475725193
ISBN 1475725191
Typ produktu Ebook
Vydavatel Springer US
Datum vydání 9. března 2013
Jazyk English
Země United States
Autoři Carter, C. Barry; Williams, David B.
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