Delay Fault Testing for VLSI Circuits

Delay Fault Testing for VLSI Circuits

EnglishPaperback / softbackPrint on demand
Krstic Angela
Springer-Verlag New York Inc.
EAN: 9781461375616
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EAN 9781461375616
ISBN 1461375614
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date October 12, 2012
Pages 191
Language English
Dimensions 235 x 155
Country United States
Readership Professional & Scholarly
Authors Krstic Angela; Kwang-Ting (Tim) Cheng
Illustrations XII, 191 p.
Edition Softcover reprint of the original 1st ed. 1998
Series Frontiers in Electronic Testing
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