Structural, Syntactic, and Statistical Pattern Recognition

Structural, Syntactic, and Statistical Pattern Recognition

EnglishPaperback / softbackPrint on demand
Springer, Berlin
EAN: 9783540372363
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Detailed information

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.
EAN 9783540372363
ISBN 3540372369
Binding Paperback / softback
Publisher Springer, Berlin
Publication date August 3, 2006
Pages 939
Language English
Dimensions 235 x 155
Country Germany
Readership Professional & Scholarly
Illustrations XXI, 939 p.
Editors de Ridder, Dick; Fred Ana; Kwok, James T.; Roli Fabio; Yeung Dit-Yan
Edition 2006 ed.
Series Image Processing, Computer Vision, Pattern Recognition, and Graphics
Manufacturer information
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