Statistical Regression with Measurement Error

Statistical Regression with Measurement Error

EnglishHardback
Cheng Chi-Lun
John Wiley & Sons Inc
EAN: 9780470711064
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Detailed information

Providing a general survey of the theory of measurement error models, including the functional, structural, and ultrastructural models, this book is written in the of the Kendall and Stuart Advanced Theory of Statistics set and, like that series, includes exercises at the end of the chapters. The goal is to emphasize the ideas and practical implications of the theory in a style that does not concentrate on the theorem-proof format.
EAN 9780470711064
ISBN 047071106X
Binding Hardback
Publisher John Wiley & Sons Inc
Publication date February 26, 1999
Pages 282
Language English
Dimensions 241 x 166 x 23
Country United States
Readership Professional & Scholarly
Authors Cheng Chi-Lun; Van Ness, John W.
Manufacturer information
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