Atom Probe Field Ion Microscopy

Atom Probe Field Ion Microscopy

EnglishHardbackPrint on demand
Miller M. K.
Oxford University Press
EAN: 9780198513872
Print on demand
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Detailed information

This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
EAN 9780198513872
ISBN 0198513879
Binding Hardback
Publisher Oxford University Press
Publication date September 19, 1996
Pages 520
Language English
Dimensions 242 x 164 x 33
Country United Kingdom
Authors Cerezo A.; Hetherington M. G.; Miller M. K.; Smith FRS, G. D. W.
Illustrations 4 colour plates, numerous halftones, line figures and maps
Series Monographs on the Physics and Chemistry of Materials
Manufacturer information
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