Advances in X-Ray Analysis

Advances in X-Ray Analysis

EnglishPaperback / softbackPrint on demand
Newkirk John B.
Springer-Verlag New York Inc.
EAN: 9781468478372
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Detailed information

The featured subject of the 1966 Denver X-Ray Conference was X-Ray Diffraction Topography and Dynamical X-Ray Phenomena. One of the chairmen of the featured ses­ sions, Professor R. A. Young, made the following remarks at the conclusion of his session. We think they are quite appropriate to the occasion and with his permission we reproduce them here.
EAN 9781468478372
ISBN 1468478370
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date June 12, 2012
Pages 558
Language English
Dimensions 254 x 178
Country United States
Readership Professional & Scholarly
Authors Mallett Gavin R.; Newkirk John B.
Illustrations IX, 558 p. 220 illus.
Edition Softcover reprint of the original 1st ed. 1967
Series Advances in X-Ray Analysis
Manufacturer information
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