Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

EnglishPaperback / softbackPrint on demand
Goldstein, Joseph
Springer-Verlag New York Inc.
EAN: 9781461349693
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EAN 9781461349693
ISBN 1461349699
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date May 31, 2013
Pages 689
Language English
Dimensions 254 x 178
Country United States
Readership Professional & Scholarly
Authors Echlin Patrick; Goldstein, Joseph; Joy, David C.; Lifshin Eric; Lyman Charles E.; Michael J.R.; Newbury Dale E.; Sawyer, Linda
Illustrations XIX, 689 p.
Edition Third Edition 2003
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