Measurement Error in Nonlinear Models

Measurement Error in Nonlinear Models

EnglishHardbackPrint on demand
Carroll, Raymond J.
Taylor & Francis Inc
EAN: 9781584886334
Print on demand
Delivery on Monday, 20. of July 2026
CZK 3,645
Common price CZK 4,050
Discount 10%
pc
Do you want this product today?
Megabooks Praha Korunní
not available
Librairie Francophone Praha Štěpánská
not available
Megabooks Ostrava
not available
Megabooks Olomouc
not available
Megabooks Plzeň
not available
Megabooks Brno
not available
Megabooks Hradec Králové
not available
Megabooks České Budějovice
not available
Megabooks Liberec
not available

Detailed information

It’s been over a decade since the first edition of Measurement Error in Nonlinear Models splashed onto the scene, and research in the field has certainly not cooled in the interim. In fact, quite the opposite has occurred. As a result, Measurement Error in Nonlinear Models: A Modern Perspective, Second Edition has been revamped and extensively updated to offer the most comprehensive and up-to-date survey of measurement error models currently available.

What’s new in the Second Edition?

· Greatly expanded discussion and applications of Bayesian computation via Markov Chain Monte Carlo techniques

· A new chapter on longitudinal data and mixed models

· A thoroughly revised chapter on nonparametric regression and density estimation

· A totally new chapter on semiparametric regression

· Survival analysis expanded into its own separate chapter

· Completely rewritten chapter on score functions

· Many more examples and illustrative graphs

· Unique data sets compiled and made available online

In addition, the authors expanded the background material in Appendix A and integrated the technical material from chapter appendices into a new Appendix B for convenient navigation. Regardless of your field, if you’re looking for the most extensive discussion and review of measurement error models, then Measurement Error in Nonlinear Models: A Modern Perspective, Second Edition is your ideal source.

EAN 9781584886334
ISBN 1584886331
Binding Hardback
Publisher Taylor & Francis Inc
Publication date June 21, 2006
Pages 484
Language English
Dimensions 229 x 152
Country United States
Authors Carroll, Raymond J.; Crainiceanu Ciprian M.; Ruppert David; Stefanski Leonard A.
Illustrations 75 Illustrations, black and white
Series editors Isham Valerie; Keiding Niels; Louis Thomas A.; Murphy Susan.A; Reid N.; Tibshirani, R.J.; Tong Howell
Edition 2 ed
Series Chapman & Hall/CRC Monographs on Statistics and Applied Probability
Manufacturer information
The manufacturer's contact information is currently not available online, we are working intensively on the axle. If you need information, write us on [email protected], we will be happy to provide it.