Artificial Intelligence Approach to Test Generation

Artificial Intelligence Approach to Test Generation

EnglishPaperback / softbackPrint on demand
Singh Narinder
Springer-Verlag New York Inc.
EAN: 9781461291831
Print on demand
Delivery on Friday, 14. of August 2026
CZK 2,351
Common price CZK 2,612
Discount 10%
pc
Do you want this product today?
Megabooks Praha Korunní
not available
Librairie Francophone Praha Štěpánská
not available
Megabooks Ostrava
not available
Megabooks Olomouc
not available
Megabooks Plzeň
not available
Megabooks Brno
not available
Megabooks Hradec Králové
not available
Megabooks České Budějovice
not available
Megabooks Liberec
not available
EAN 9781461291831
ISBN 1461291836
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date October 5, 2011
Pages 194
Language English
Dimensions 235 x 155
Country United States
Readership Professional & Scholarly
Authors Singh Narinder
Illustrations XIV, 194 p.
Edition Softcover reprint of the original 1st ed. 1987
Series Springer International Series in Engineering and Computer Science
Manufacturer information
The manufacturer's contact information can be found here.