Advances in X-Ray Analysis

Advances in X-Ray Analysis

EnglishPaperback / softbackPrint on demand
Barrett, Charles S.
Springer-Verlag New York Inc.
EAN: 9781461283034
Print on demand
Delivery on Friday, 14. of August 2026
CZK 1,175
Common price CZK 1,306
Discount 10%
pc
Do you want this product today?
Megabooks Praha Korunní
not available
Librairie Francophone Praha Štěpánská
not available
Megabooks Ostrava
not available
Megabooks Olomouc
not available
Megabooks Plzeň
not available
Megabooks Brno
not available
Megabooks Hradec Králové
not available
Megabooks České Budějovice
not available
Megabooks Liberec
not available

Detailed information

The continuing success of the Denver X-Ray Conference is, it seems to me, the consequence of three equally important facets of each meeting. These are: 1) the collegial atmosphere and workshops at which experts and novices mix, talk, and informally share information at many levels; 2) the plenary session at which information is presented that intentionally brings new ideas to attendees to broaden the scope of the field; and 3) the traditional sessions in which interesting reports on current research and applications are presented in a timely and professional way. The first and last of these are discussed separately by Paul Predecki and are organized (no small task!) by the entire advisory board. This requires much more than deciding whether yet another workshop on specimen preparation is needed and whom to prevail upon to organize and present it. In fact, few attendees at these workshops ever appreciate the level of effort that Paul and his staff expend to make sure everything comes off smoothly, even when hundreds of copies of handouts need to be whipped off at the last moment, travel problems arise, or unusual audio­ visual aids are suddenly needed. But my topic here is the second of the three facets listed above - the plenary session. Organizing this falls to a single individual, on the theory that one person can then approach enough others as speakers to put together a unified and yet diverse program of related and interesting review papers.
EAN 9781461283034
ISBN 1461283035
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date October 3, 2011
Pages 542
Language English
Dimensions 244 x 170
Country United States
Readership Professional & Scholarly
Authors Barrett, Charles S.
Illustrations 542 p.
Series Advances in X-Ray Analysis
Manufacturer information
The manufacturer's contact information is currently not available online, we are working intensively on the axle. If you need information, write us on [email protected], we will be happy to provide it.