Scanning Electron Microscopy and X-Ray Microanalysis

Scanning Electron Microscopy and X-Ray Microanalysis

EnglishPaperback / softbackPrint on demand
Goldstein, Joseph
Springer-Verlag New York Inc.
EAN: 9781461276531
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EAN 9781461276531
ISBN 1461276535
Binding Paperback / softback
Publisher Springer-Verlag New York Inc.
Publication date September 28, 2011
Pages 840
Language English
Dimensions 254 x 178
Country United States
Readership Professional & Scholarly
Authors Echlin Patrick; Fiori Charles; Goldstein, Joseph; Joy, David C.; Lifshin Eric; Lyman Charles E.; Newbury Dale E.; Romig Jr., Alton D.
Illustrations 840 p.
Edition Second Edition 1992
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