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Author: Tan, Cher Ming
Electromigration In Ulsi Interconnections

Electromigration In Ulsi Interconnections

Cher Ming Tan, Tan
EnglishEbook
World Scientific Publishing Company
ISBN: 9789814467933
Available online
Available online
CZK 1,122 -10%
Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Tan, Cher Ming
EnglishEbook
Springer Nature Singapore
ISBN: 9789814451215
Available online
Available online
CZK 1,539 -10%
Electromigration In Ulsi Interconnections

Electromigration In Ulsi Interconnections

Tan, Cher Ming (Ntu, S'pore)
EnglishHardback
World Scientific Publishing Co Pte Ltd
ISBN: 9789814273329
On order
Delivery on Monday, 10. of August 2026
On order
Delivery on Monday, 10. of August 2026
CZK 3,000 -10%
Reliability and Failure Analysis of High-Power LED Packaging

Reliability and Failure Analysis of High-Power LED Packaging

Tan, Cher Ming
EnglishEbook
Elsevier Science
ISBN: 9780128224076
Available online
Available online
CZK 5,964 -10%
Electromigration Modeling at Circuit Layout Level

Electromigration Modeling at Circuit Layout Level

Tan, Cher Ming
EnglishPaperback / softbackPrint on demand
Springer Verlag, Singapore
ISBN: 9789814451208
Print on demand
Delivery on Friday, 28. of August 2026
Print on demand
Delivery on Friday, 28. of August 2026
CZK 1,306 -10%
Graphene and VLSI Interconnects

Graphene and VLSI Interconnects

Tan, Cher-Ming
EnglishHardbackPrint on demand
Jenny Stanford Publishing
ISBN: 9789814877824
Print on demand
Delivery on Monday, 24. of August 2026
Print on demand
Delivery on Monday, 24. of August 2026
CZK 3,981 -10%
Graphene and VLSI Interconnects

Graphene and VLSI Interconnects

Tan, Cher-Ming
EnglishEbook
Taylor and Francis Group
ISBN: 9781000470680
Available online
Available online
CZK 4,216 -10%
Graphene and VLSI Interconnects

Graphene and VLSI Interconnects

Tan, Cher-Ming
EnglishEbook
Taylor and Francis Group
ISBN: 9781000470673
Available online
Available online
CZK 4,216 -10%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
Available online
CZK 3,061 -10%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Tan, Cher Ming
EnglishPaperback / softbackPrint on demand
Springer London Ltd
ISBN: 9781447126416
Print on demand
Delivery on Friday, 28. of August 2026
Print on demand
Delivery on Friday, 28. of August 2026
CZK 2,612 -10%
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections

Tan, Cher Ming
EnglishHardbackPrint on demand
Springer London Ltd
ISBN: 9780857293091
Print on demand
Delivery on Friday, 28. of August 2026
Print on demand
Delivery on Friday, 28. of August 2026
CZK 2,612 -10%
Reliability and Failure Analysis of High-Power LED Packaging
Print on demand
Delivery on Thursday, 13. of August 2026
CZK 4,650 -10%