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Author: Strong, Alvin W.
Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Strong Alvin W.
EnglishHardback
John Wiley & Sons Inc
ISBN: 9780471731726
On order
Delivery on Thursday, 6. of August 2026
On order
Delivery on Thursday, 6. of August 2026
CZK 4,919 -10%
Reliability Wearout Mechanisms in Advanced CMOS Technologies

Reliability Wearout Mechanisms in Advanced CMOS Technologies

Strong, Alvin W.
EnglishEbook
WILEY
ISBN: 9780470455258
Available online
Available online
CZK 5,608 -10%